Professional IC Substrate R&D and Manufacturing

AS9100

Aviation-grade standard factory

ROHS

Certification Standards

25μm

Minimum line width & spacing

0.05mm

Minimum laser drilling

12-30 days

Sample lead time
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Why Choose Our IC Substrate

We combine advanced technology, strict quality control and customer-centric service to deliver exceptional IC Substrate solutions.

Premium Materials

We stock substrates from leading brands including SYTECH, BT, Mitsubishi, Doushan, Toshiba, LG, Yinghua, ABF to ensure stable performance and adaptability.

Precision Manufacturing

With minimum line width/spacing of 25μm and minimum laser drilling diameter of 0.05mm,
Equipped with LDI exposure machines and high-precision laser drilling.

Full-process QC

Real-time online AOI monitoring throughout the process, 100% inspection of samples with professional IC substrate micro-probe flying probe testers.

Quality Certification

Compliant with AS9100 Aerospace-Grade Quality Management Certification and ROHS environmental standards, ensuring every substrate meets industry highest requirements.

Fast Delivery

Sample lead time only 12-30 days, supporting full-process customization from prototype to small-batch production to meet rapid iteration needs.

Expert Team

20-strong R&D team with proven track records in top-tier IC substrate R&D and production, providing one-stop service from technical consultation to customized production.

Our Products of IC Substrate

SiP Substrate

SiP Substrate

System-in-Package (SiP) is currently widely used in various portable communication electronics products.

PBGA Substrate

PBGA Substrate

Wire-bond plastic packaging substrates are currently widely used in the packaging of medium/low contact density electronic components such as computer and communication products.

FCCSP Substrate

FCCSP Substrate

Widely used in the packaging of low contact density electronic components such as consumer electronics and communication devices, which emphasize lightweight, thinness, compact dimensions and compactness.

FCBGA Substrate

FCBGA Substrate

Flip-chip packaging substrates are currently widely used in the packaging of high-speed computing/high contact density electronic components such as computers and communication devices.

Memory Card Substrate

Memory Card Substrate

Memory Card Packaging Substrates (MCP Substrates) are currently widely used in various electronic products such as memory cards, computers, mobile phones, storage devices, and servers.

LGA Substrate

LGA Substrate

Land Grid Array (LGA) is primarily utilized in high-end electronic products centered on semiconductors and chips and demanding high-frequency, high-power, and high-density I/O scenarios.

Product Features / Manufacturing Capabilities

Thickness & Tolerance

Board thickness 0.1~1.2mm, tolerance ±30μm

Small and dense holes

30~150μm hole diameter, hundreds to thousands of micro holes per PCS

Fine line width and spacing

min 25μm

Small pads

Minimum BGA pad diameter: 50μm

Interconnection technology

Buried, blind, and stacked via technologies

Surface treatment

Ni/Au, soft gold, hard gold, Ni/Pd/Au, etc.

Small unit size

≤150×150mm

Dimensional tolerance

min ±50 μm

Material
SYTECH, BT, Mitsubishi, Doushan, Toshiba, LG, Yinghua, Ajinomoto Buildup Film(ABF)
MASS Production Samples Production
Layer 2-10 layers 2-12 layers
Min Drilling 50um 50um
Bonding Finger Min.Pitch 105um 95um
Min.Width 35um 35um
Circuit Line Min.Pitch 95um 25um
Min.Width 25um 25um
Min.Spacing 25um 25um
Min.Welding ring 80um 80um
Min.Thickness 2L 100um 100um
4L 300um 200um
6L 400um 300um
10L 800um /
12L 1000um /
Line to PAD/EDGE 100um 75um
Solder mask Solder DAM 50um 50um
Solder PAD 80um 70um
Thickness 20+/-5um 20+/-5um
Flatness 5um 5um
Surface Finish Hard Gold Ni:5-15μm Au:0.2-0.5μm Ni:5-15μm Au:0.2-2μm
Soft Gold Ni:5-15μm Au:0.3-0.8μm Ni:5-15μm Au:0.3-2μm
ENEPIG-WB Ni:3-8μm, Pd:0.1-0.2μm Au:0.1-0.2μm Ni:3-8μm, Pd:0.1-0.2μm Au:0.1-2μm
ENEPIG-SMT Ni:3-8μm, Pd:0.05-0.15μm Au:0.05-0.15μm Ni:3-8μm, Pd:0.05-0.15μm Au:0.05-2μm
OSP OSP:0.1-0.3μm OSP:0.1-0.3μm

Process Flow

IC Substrate Factory - DES Production Line
DES Production Line
IC Substrate Factory - Fully Automatic LDI Exposure
Fully Automatic LDI Exposure
IC Substrate Factory - Laser Drilling
Laser Drilling
IC Substrate Factory - Through-hole/Plug-hole Plating
Through-hole/Plug-hole Plating
IC Substrate Factory - FQC 180x CCD Inspection
FQC 180x CCD Inspection
IC Substrate Factory - ET Testing
ET Testing
Substrate Fabrication Processes

Technical Challenges

1

Ultra-thin core board processing control technology

Ultra-thin core boards are prone to warpage and expansion/contraction issues. Breakthroughs are required in process technologies such as deformation/expansion-contraction control, lamination structure design, board expansion-contraction management, lamination parameters optimization, and interlayer alignment systems. This ensures effective control of warpage and lamination thickness for ultra-thin core boards.

2

Micro via processing technology

Including laser drilling capability for micro blind vias, mechanical drilling capability for micro through vias, via filling technology, and stacked via technology.

3

Ultra-fine circuit fabrication technology

Including copper reduction capability, circuit compensation control, plating uniformity control, and etching uniformity control.

4

Interlayer alignment technology

Including multi-layer lamination technology, LDI (Laser Direct Imaging) alignment exposure technology, and positioning reference technology.

5

Solder mask fabrication technology

Including solder mask plugging (for blind vias and through vias), solder mask alignment accuracy, and solder mask flatness.

6

Surface finish technology

Including electroplated soft thick gold, electroplated hard thick gold, and electroless nickel palladium gold (ENEPIG), with requirements for pad flatness and fine-grained crystallization.

7

Testing and inspection technology

Testing of micro bonding pads requires the support of high-precision AOI (Automatic Optical Inspection) equipment and micro-probe flying probe testers for continuity testing. Meanwhile, an AOI repair process must be established to avoid quality issues caused by micro-defects.

Have any questions? Our technical team is ready to help.

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